LIRC@SFIT

  The Learning and Information Resource Centre is pleased to inform you about the  Top   Searches  from " IEEE   Xplore   Digital Library " as of 29th December 2023  . SN RESEARCH DOMAIN RESOURCE MOST POPULAR MOST POPULAR 1 IMAGE PROCESSING IEEE XPLORE Millimeter Wave Mobile Communications for 5G Cellular: It Will Work! Theodore S. Rappaport ; Shu Sun ; Rimma Mayzus ; Hang Zhao ; Yaniv Azar ; Kevin Wang ; George N. Wong ; Jocelyn K. Schulz ; Mathew Samimi ; Felix Gutierrez IEEE Access Year: 2013 |  Volume: 1  | Journal Article | Publisher: IEEE Cited by:  Papers (5397)  |  Patents (81)   The Internet of Things for Health Care: A Comprehensive Survey S. M. Riazul Islam ; Daehan Kwak ; MD. Humaun Kabir ; Mahmud Hossain ; Kyung-Sup Kwak IEEE Access ...

The Indian National Space Promotion and Authorisation Centre (IN-SPACe), in collaboration with Isro and leading academic institutions, has introduced a cutting-edge short-term course aimed at advancing skills in the space sector. “The programme, which commenced on December 17, focuses on Orbital Mechanics, Attitude Dynamics and Control, Space-Based Navigation, and Mission Planning,” an IN-SPACe statement issued Monday read.  Read more at: http://timesofindia.indiatimes.com/articleshow/106095250.cms?from=mdr&utm_source=contentofinterest&utm_medium=text&utm_campaign=cppst

  The test is accepted by more than 12,000 institutions in more than 160 countries and is universally accepted in popular destinations  The English language test TOEFL  will soon be offered as a personalised test depending upon individual requirements as well as the test takers' background to make the assessment as unbiased as possible, according to the Educational Testing Service. Read the full article

  SN RESEARCH DOMAIN RESOURCE MOST CITED BY PAPERS 1 MOST CITED BY PAPERS 2 1 IMAGE PROCESSING IEEE XPLORE J. Deng, W. Dong, R. Socher, L. -J. Li, Kai Li and Li Fei-Fei, "ImageNet: A large-scale hierarchical image database," 2009 IEEE Conference on Computer Vision and Pattern Recognition, Miami, FL, USA, 2009, pp. 248-255, doi: 10.1109/CVPR.2009.5206848. URL:  https://ieeexplore.ieee. org/stamp/stamp.jsp?tp=& arnumber=5206848&isnumber= 5206488 C.  Szegedy et al., "Going deeper with convolutions," 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Boston, MA, USA, 2015, pp. 1-9, doi: 10.1109/CVPR.2015.7298594.   URL:  URL:  https://ieeexplore. ieee.org/stamp/stamp.jsp?tp=& arnumber=7298594&isnumber= 7298593 2 MACHINE LEARNING IEEE XPLORE C. Szegedy  et al ., "Going deeper with convolutions,"  2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) , Boston, MA, USA, 2015, pp. 1-9, doi: 10.1109/CVP...